JPH0368044U - - Google Patents

Info

Publication number
JPH0368044U
JPH0368044U JP12930389U JP12930389U JPH0368044U JP H0368044 U JPH0368044 U JP H0368044U JP 12930389 U JP12930389 U JP 12930389U JP 12930389 U JP12930389 U JP 12930389U JP H0368044 U JPH0368044 U JP H0368044U
Authority
JP
Japan
Prior art keywords
test object
frequency heating
thermal cycle
internal pressure
cooling medium
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12930389U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12930389U priority Critical patent/JPH0368044U/ja
Publication of JPH0368044U publication Critical patent/JPH0368044U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
JP12930389U 1989-11-07 1989-11-07 Pending JPH0368044U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12930389U JPH0368044U (en]) 1989-11-07 1989-11-07

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12930389U JPH0368044U (en]) 1989-11-07 1989-11-07

Publications (1)

Publication Number Publication Date
JPH0368044U true JPH0368044U (en]) 1991-07-03

Family

ID=31676942

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12930389U Pending JPH0368044U (en]) 1989-11-07 1989-11-07

Country Status (1)

Country Link
JP (1) JPH0368044U (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019049418A (ja) * 2017-09-08 2019-03-28 国立大学法人 名古屋工業大学 熱サイクル試験装置、熱サイクル試験方法、半導体装置の製造方法、及びプログラム

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019049418A (ja) * 2017-09-08 2019-03-28 国立大学法人 名古屋工業大学 熱サイクル試験装置、熱サイクル試験方法、半導体装置の製造方法、及びプログラム

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